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Microstructural stability of NiO-containing spin valves annealed at room temperature
Zhang, AM; Cai, HL; Zhai, ZY; Du, J; Wu, XS; Jia, QJ; Jia QJ(贾全杰)
2009
发表期刊CHINESE PHYSICS C
卷号33期号:11页码:944-948
通讯作者[Zhang Ai-Mei] Hohai Univ, Coll Sci, Nanjing 210098, Peoples R China ; [Zhang Ai-Mei ; Cai Hong-Ling ; Zhai Zhang-Yin ; Du Jun ; Wu Xiao-Shan] Nanjing Univ, Solid State Microstruct Lab, Dept Phys, Nanjing 210093, Peoples R China ; [Jia Quan-Jie] CAS, BSRF, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
摘要Microstructure of NiO-containing Co/Cu/Co spin valves (CCC-SV) annealed at room temperature for nearly four years has been studied by synchrotron radiation X-ray diffraction. With the annealing time expanding, the thickness of each sub-layer remains nearly unchanged while the interface roughness varies obviously compared with that of samples without annealing. The roughness at the interface of NiO/Co decreases with the annealing time increasing for both of the samples with NiO layer on the top (TSV) and under the bottom (BSV) of CCC-SV. On the other hand, the roughness at Co/Cu interface increases with the annealing time expanding for BSV while it decreases for TSV. These results indicate that the structure of TSV is more stable than that of BSV.
关键词interface roughness X-ray reflectivity spin valves
学科领域Physics
研究领域[WOS]Physics ; Physics
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语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Nuclear ; Physics, Particles & Fields
WOS记录号WOS:000271893700002
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238781
专题多学科研究中心
作者单位中国科学院高能物理研究所
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Zhang, AM,Cai, HL,Zhai, ZY,et al. Microstructural stability of NiO-containing spin valves annealed at room temperature[J]. CHINESE PHYSICS C,2009,33(11):944-948.
APA Zhang, AM.,Cai, HL.,Zhai, ZY.,Du, J.,Wu, XS.,...&贾全杰.(2009).Microstructural stability of NiO-containing spin valves annealed at room temperature.CHINESE PHYSICS C,33(11),944-948.
MLA Zhang, AM,et al."Microstructural stability of NiO-containing spin valves annealed at room temperature".CHINESE PHYSICS C 33.11(2009):944-948.
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