Microstructural stability of NiO-containing spin valves annealed at room temperature
Zhang, AM; Cai, HL; Zhai, ZY; Du, J; Wu, XS; Jia, QJ; Jia QJ(贾全杰)
刊名CHINESE PHYSICS C
2009
卷号33期号:11页码:944-948
关键词interface roughness X-ray reflectivity spin valves
学科分类Physics
通讯作者[Zhang Ai-Mei] Hohai Univ, Coll Sci, Nanjing 210098, Peoples R China ; [Zhang Ai-Mei ; Cai Hong-Ling ; Zhai Zhang-Yin ; Du Jun ; Wu Xiao-Shan] Nanjing Univ, Solid State Microstruct Lab, Dept Phys, Nanjing 210093, Peoples R China ; [Jia Quan-Jie] CAS, BSRF, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
英文摘要Microstructure of NiO-containing Co/Cu/Co spin valves (CCC-SV) annealed at room temperature for nearly four years has been studied by synchrotron radiation X-ray diffraction. With the annealing time expanding, the thickness of each sub-layer remains nearly unchanged while the interface roughness varies obviously compared with that of samples without annealing. The roughness at the interface of NiO/Co decreases with the annealing time increasing for both of the samples with NiO layer on the top (TSV) and under the bottom (BSV) of CCC-SV. On the other hand, the roughness at Co/Cu interface increases with the annealing time expanding for BSV while it decreases for TSV. These results indicate that the structure of TSV is more stable than that of BSV.
类目[WOS]Physics, Nuclear ; Physics, Particles & Fields
研究领域[WOS]Physics
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语种英语
WOS记录号WOS:000271893700002
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238781
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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Zhang, AM,Cai, HL,Zhai, ZY,et al. Microstructural stability of NiO-containing spin valves annealed at room temperature[J]. CHINESE PHYSICS C,2009,33(11):944-948.
APA Zhang, AM.,Cai, HL.,Zhai, ZY.,Du, J.,Wu, XS.,...&贾全杰.(2009).Microstructural stability of NiO-containing spin valves annealed at room temperature.CHINESE PHYSICS C,33(11),944-948.
MLA Zhang, AM,et al."Microstructural stability of NiO-containing spin valves annealed at room temperature".CHINESE PHYSICS C 33.11(2009):944-948.
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