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Ratio-contrast imaging of dual-energy absorption for element mapping with a scanning transmission X-ray microscope
Zhang, XZ; Xu, ZJ; Tai, RZ; Zhen, XJ; Wang, Y; Guo, Z; Yan, R; Chang, R; Wang B(汪冰); Li M(李敏); Wang, B; Li, M; Zhao, J; Gao, F
2010
发表期刊JOURNAL OF SYNCHROTRON RADIATION
卷号17期号:6页码:804-809
通讯作者[Zhang, X. Z. ; Xu, Z. J. ; Tai, R. Z. ; Zhen, X. J. ; Wang, Y. ; Guo, Z. ; Yan, R. ; Chang, R.] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201204, Peoples R China ; [Wang, B. ; Li, M.] Chinese Acad Sci, Inst High Energy Phys, CAS Key Lab Biomed Effects Nanomat & Nanosafety, Beijing 100049, Peoples R China ; [Wang, B. ; Li, M.] Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Analyt Tech, Beijing 100049, Peoples R China ; [Zhao, J. ; Gao, F.] Chinese Acad Sci, Inst Chem, Beijing 100190, Peoples R China
文章类型Article
摘要The detection of chemical mapping with a spatial resolution of 30 nm has been achieved with a scanning transmission X-ray microscope at the Shanghai Synchrotron Radiation Facility. For each specimen, two absorption images were scanned separately with energies E (1) and E (2): E (1) was focused on the absorption edge of the chosen element and E (2) was focused below the edge. A K-edge division method is proposed and applied to obtain the element mapping. Compared with the frequently used K-edge subtraction method, this ratio-contrast method is shown to be more accurate and sensitive in identifying the elements of interest, where the definition of the contrast threshold is simple and clear in physics. Several examples are presented to illustrate the effectiveness of the method.
关键词X-ray absorption edge X-ray microscopy element microanalysis
学科领域Instruments & Instrumentation; Optics; Physics
DOI10.1107/S0909049510031250
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语种英语
WOS研究方向Instruments & Instrumentation ; Optics ; Physics
WOS类目Instruments & Instrumentation ; Optics ; Physics, Applied
WOS记录号WOS:000283599600014
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被引频次:32[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238524
专题多学科研究中心
实验物理中心
作者单位中国科学院高能物理研究所
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Zhang, XZ,Xu, ZJ,Tai, RZ,et al. Ratio-contrast imaging of dual-energy absorption for element mapping with a scanning transmission X-ray microscope[J]. JOURNAL OF SYNCHROTRON RADIATION,2010,17(6):804-809.
APA Zhang, XZ.,Xu, ZJ.,Tai, RZ.,Zhen, XJ.,Wang, Y.,...&Gao, F.(2010).Ratio-contrast imaging of dual-energy absorption for element mapping with a scanning transmission X-ray microscope.JOURNAL OF SYNCHROTRON RADIATION,17(6),804-809.
MLA Zhang, XZ,et al."Ratio-contrast imaging of dual-energy absorption for element mapping with a scanning transmission X-ray microscope".JOURNAL OF SYNCHROTRON RADIATION 17.6(2010):804-809.
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