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Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS
Xie, Z; Kojima, I; Xie, YI; He, B; Chen, DL; Liu, T; Hu, TD; Zhang, XY; Wei, SQ; Xie YN(谢亚宁); Liu T(刘涛); Hu TD(胡天斗)
2005
发表期刊PHYSICA SCRIPTA
卷号T115页码:784-786
通讯作者[Xie, Zhi ; He, Bo ; Chen, Dongliang ; Wei, Shiqiang] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Peoples R China ; [Kojima, Isao] Natl Inst Adv Ind Sci & Technol, AIST Tsukuba Cent 5, Higashi Ku, Tsukuba, Ibaraki 3058565, Japan ; [Xie, Yaning ; Liu, Tao ; Hu, Tiandou] Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China ; [Zhang, Xinyi] Fudan Univ, Synchrotron Radiat Res Ctr, Shanghai 200433, Peoples R China ; [Zhang, Xinyi] Fudan Univ, Natl Key Lab, Surface Phys Lab, Shanghai 200433, Peoples R China
文章类型Article
摘要The local structures of Pt thin films with thicknesses from 3 to 105 nm grown at 298 K have been studied by grazing incidence fluorescence XAFS technique. The results indicate that the bond length R = 2.77 angstrom and coordination number N = 12.0 of the first shell around Pt atoms in the Pt (105 nm) and Pt (30 nm) thin films are the same as those in Pt foil, except that the disorder degree sigma increases by about 8%. The magnitude peaks (located at 2.77, 3.92, 4.80 and 5.55 angstrom) appearing in the radial distribution function curves suggest that the Pt (105 nm) and Pt (30 nm) thin films keep a long-range order. With thickness decreasing from 105 to 10 nm, the Debye-Waller factor sigma(2) increases to 6.4 x 10(-3) angstrom(2) (sigma(2) = 4.8 x 10(-3) angstrom(2) for the Pt foil). For the Pt (3 nm) ultra-thin film, R-1, N-1 and sigma(2)(1) are 2.78 angstrom, 10.1 and 7.1 x 10(-3) angstrom(2), respectively. This implies that N-1 largely decreases and sigma(2)(1) strongly increases in the Pt (3 nm) ultra-thin film. Moreover, its magnitude peaks of the higher shells in the radial distribution function disappear for the Pt (3 nm) ultra-thin film. This result shows that the Pt lattice is largely distorted and the medium-range order around Pt atoms is completely destroyed for the Pt (3 nm) ultra-thin film. We consider that the Pt lattice distortion of the Pt ultra-thin film originates from both interaction between Pt particles and SiO2 substrate, and Pt grains with a smaller size forming a surface structure defect.
学科领域Physics
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语种英语
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
WOS记录号WOS:000204272100235
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238482
专题多学科研究中心
加速器中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Xie, Z,Kojima, I,Xie, YI,et al. Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS[J]. PHYSICA SCRIPTA,2005,T115:784-786.
APA Xie, Z.,Kojima, I.,Xie, YI.,He, B.,Chen, DL.,...&胡天斗.(2005).Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS.PHYSICA SCRIPTA,T115,784-786.
MLA Xie, Z,et al."Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS".PHYSICA SCRIPTA T115(2005):784-786.
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