Chinese Acad Sci, Inst High Energy Phys, Beijing 100080, Peoples R China
; Peking Univ, Dept Tech Phys, Beijing 100871, Peoples R China
; Inst Atom Energy, Beijing 102413, Peoples R China
Wavelength dispersive position sensitive spectrometer(PSS) with a flatcrystal is a-new type of high energy resolution equipment for analyzing X rays. It can be used in study of elemental analysis, chemical states and atomic physics. The paper describes the performance of PSS developed by us as well as the principle of PSS and its core part-position sensitive proportional counter. The energy resolution of 25eV, 15eV and 7eV have been obtained for Fe-55, Ti and Si, respectively, using developed PSS. Such resolution can meet the requirement in elements analyses.