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On the characterization of metallic superlattice structures by X-ray diffraction
Xu, M; Yu, WX; Luo, GM; Chai, CL; Zhao, T; Chen, F; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Wu ZH(吴忠华); Wang DW(王德武)
1999
发表期刊MODERN PHYSICS LETTERS B
卷号13期号:18页码:663-669
通讯作者CAS, Inst Phys, Beijing 10080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Synchrotron Radiat Lab, Beijing 100039, Peoples R China
摘要To solve the problem on the microstructural characterization of metallic superlattices, taking the NiFe/Cu superlattices as example, we show that the structures of metallic superlattices can be characterized exactly by combining low-angle X-ray diffraction with high-angle X-ray diffraction. First, we determine exactly the total film thickness by a straightforward and precise method based on a modified Bragg law from the subsidiary maxima around the low-angle X-ray diffraction peak. Then, by combining with the simulation of high-angle X-ray diffraction, we obtain the structural parameters such as the superlattice period, the sublayer and buffer thickness. This characterization procedure is also applicable to other types of metallic superlattices.
文章类型Article
学科领域Physics
研究领域[WOS]Physics
DOI10.1142/S021798499900083X
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语种英语
WOS类目Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical
WOS记录号WOS:000083556700002
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238222
专题多学科研究中心
作者单位中国科学院高能物理研究所
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Xu, M,Yu, WX,Luo, GM,et al. On the characterization of metallic superlattice structures by X-ray diffraction[J]. MODERN PHYSICS LETTERS B,1999,13(18):663-669.
APA Xu, M.,Yu, WX.,Luo, GM.,Chai, CL.,Zhao, T.,...&王德武.(1999).On the characterization of metallic superlattice structures by X-ray diffraction.MODERN PHYSICS LETTERS B,13(18),663-669.
MLA Xu, M,et al."On the characterization of metallic superlattice structures by X-ray diffraction".MODERN PHYSICS LETTERS B 13.18(1999):663-669.
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