On the characterization of metallic superlattice structures by X-ray diffraction
Xu, M; Yu, WX; Luo, GM; Chai, CL; Zhao, T; Chen, F; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Wu ZH(吴忠华); Wang DW(王德武)
刊名MODERN PHYSICS LETTERS B
1999
卷号13期号:18页码:663-669
学科分类Physics
DOI10.1142/S021798499900083X
通讯作者CAS, Inst Phys, Beijing 10080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Synchrotron Radiat Lab, Beijing 100039, Peoples R China
文章类型Article
英文摘要To solve the problem on the microstructural characterization of metallic superlattices, taking the NiFe/Cu superlattices as example, we show that the structures of metallic superlattices can be characterized exactly by combining low-angle X-ray diffraction with high-angle X-ray diffraction. First, we determine exactly the total film thickness by a straightforward and precise method based on a modified Bragg law from the subsidiary maxima around the low-angle X-ray diffraction peak. Then, by combining with the simulation of high-angle X-ray diffraction, we obtain the structural parameters such as the superlattice period, the sublayer and buffer thickness. This characterization procedure is also applicable to other types of metallic superlattices.
类目[WOS]Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical
研究领域[WOS]Physics
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语种英语
WOS记录号WOS:000083556700002
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238222
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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GB/T 7714
Xu, M,Yu, WX,Luo, GM,et al. On the characterization of metallic superlattice structures by X-ray diffraction[J]. MODERN PHYSICS LETTERS B,1999,13(18):663-669.
APA Xu, M.,Yu, WX.,Luo, GM.,Chai, CL.,Zhao, T.,...&王德武.(1999).On the characterization of metallic superlattice structures by X-ray diffraction.MODERN PHYSICS LETTERS B,13(18),663-669.
MLA Xu, M,et al."On the characterization of metallic superlattice structures by X-ray diffraction".MODERN PHYSICS LETTERS B 13.18(1999):663-669.
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