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Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs
Huang, XR; Jiang, SS; Liu, WJ; Wu, XS; Feng, D; Wang, ZG; Han, Y; Wang, JY; Han Y(韩勇)
1996
发表期刊JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷号29期号:4页码:371-377
通讯作者CTR ADV STUDIES SCI & TECHNOL MICROSTRUCT,NANJING 210093,PEOPLES R CHINA ; INST HIGH ENERGY PHYS,BSRL,BEIJING 100039,PEOPLES R CHINA ; SHANDONG UNIV,INST CRYSTAL MAT,JINAN 250100,PEOPLES R CHINA
文章类型Article
摘要White-beam synchrotron topography has been demonstrated to be well suited for observation of all kinds of ferroelastic and ferroelectric twin domains. It is found that the domains that are misorientated against each other always appear as orientation contrasts in the topographs, while the antiparallel domains with parallel lattices may show different diffraction intensity by the synchrotron-radiation anomalous-scattering effect. Based on the reciprocal-lattice splitting and the diffraction geometry, a general method of determination of the image displacement associated with two misoriented domains is given to explain their orientation contrast. It is also revealed that the anomalous-scattering contrast of antiparallel domains arises from the anomalous-dispersion terms of the noncentrosymmetric atoms in the unit cell of ferroelectric crystals.
学科领域Crystallography
研究领域[WOS]Crystallography ; Crystallography
DOI10.1107/S002188989600221X
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语种英语
研究领域[WOS]Crystallography ; Crystallography
WOS类目Crystallography
WOS记录号WOS:A1996VF65000010
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被引频次:8[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/237209
专题多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Huang, XR,Jiang, SS,Liu, WJ,et al. Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,1996,29(4):371-377.
APA Huang, XR.,Jiang, SS.,Liu, WJ.,Wu, XS.,Feng, D.,...&韩勇.(1996).Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs.JOURNAL OF APPLIED CRYSTALLOGRAPHY,29(4),371-377.
MLA Huang, XR,et al."Contrast of ferroelastic and ferroelectric domains in white-beam X-ray topographs".JOURNAL OF APPLIED CRYSTALLOGRAPHY 29.4(1996):371-377.
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