IHEP OpenIR  > 院士  > 期刊论文
Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis
Kang, SX; Sun, X; Ju X(巨新); Huang YY(黄宇营); Xian DC(冼鼎昌); Ju, X; Huang, YY; Yao, K; Wu, ZQ; Xian, DC
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
2002
卷号192期号:4页码:365-369
关键词synchrotron radiation X-ray fluorescence analysis Si(Li) detector escape peak
学科分类Instruments & Instrumentation; Nuclear Science & Technology; Physics
DOI10.1016/S0168-583X(02)00491-3
通讯作者Univ Sci & Technol, Dept Astron & Appl Phys, Hefei 230036, Anhui, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China
文章类型Article
英文摘要In synchrotron radiation X-ray fluorescence experiments, the escape peaks, generating from the Si(Li) solid detector, can disrupt seriously the quantitative and qualitative analysis. In this paper, 14 specimens, such as metals, compounds and plants, have been chosen as objectives to determine the intensities and positions of escape peaks. In all, the characteristic X-ray fluorescence peaks and their escape peaks of 12 elements have been measured. Comparing the experimental values with the standard values, the escape peaks can be discriminated. To calculate the ratios of intensities of the escape peaks and their corresponding characteristic X-ray fluorescence peaks, a simplified Si Kalpha emergent spherical distribution has been put forward. It is found that the experimental results are in accordance with that of calculation, i.e. both the experimental and theoretical ratios decrease from 1% to 0.1% with the increasing atomic number from 18 to 33 (from 1 to 9 keV in X-ray range). (C) 2002 Elsevier Science B.V. All rights reserved.
类目[WOS]Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear
研究领域[WOS]Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
原文出处查看原文
语种英语
WOS记录号WOS:000176521100003
引用统计
被引频次:8[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/237180
专题院士_期刊论文
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Kang, SX,Sun, X,Ju X,et al. Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2002,192(4):365-369.
APA Kang, SX.,Sun, X.,巨新.,黄宇营.,冼鼎昌.,...&Xian, DC.(2002).Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,192(4),365-369.
MLA Kang, SX,et al."Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 192.4(2002):365-369.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
3505.pdf(101KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Kang, SX]的文章
[Sun, X]的文章
[巨新]的文章
百度学术
百度学术中相似的文章
[Kang, SX]的文章
[Sun, X]的文章
[巨新]的文章
必应学术
必应学术中相似的文章
[Kang, SX]的文章
[Sun, X]的文章
[巨新]的文章
相关权益政策
暂无数据
收藏/分享
文件名: 3505.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。