Chinese Acad Sci, Inst High Energy Phys, Beijing 100080, Peoples R China
; Joint Inst Nucl Res, Flerov Lab Nucl React, Dubna 141980, Russia
; Japan Atom Energy Res Inst, Takasaki Radiat Chem Res Estab, Takasaki, Gumma 3701292, Japan
Polyethylene terephthalate (PET) and polycarbonate (PC) films were irradiated by S, Kr and Xe ions and were illuminated with ultraviolet light. The normalized track etch rate for PET and PC films etched in different condition was measured by conductometric experiments. It is shown that normalized track etch rate can be over 1000 for PET films, 2000 for PC films under optimized condition. TEM photographs of copper nanowires electroplated into nanoporous nuclear track membranes show that the narrowest wire diameter of copper nanowires is 20nm and that the pore diameter calculated by conductometric experiments is in agreement with the wire diameter measured by TEM when the pore diameter is over 30nm.