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A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole
Zhang, C; Zhang SN(张双南); Zhang, SN
2009
发表期刊RESEARCH IN ASTRONOMY AND ASTROPHYSICS
卷号9期号:3页码:333-340
通讯作者[Zhang, Chen] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China ; [Zhang, Chen ; Zhang, Shuang-Nan] Tsinghua Univ, Ctr Astrophys, Beijing 100084, Peoples R China ; [Zhang, Shuang-Nan] Chinese Acad Sci, Inst High Energy Phys, Key Lab Particle Astrophys, Beijing 100049, Peoples R China ; [Zhang, Shuang-Nan] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
文章类型Article
摘要High angular resolution X-ray imaging is always useful in astrophysics and solar physics. In principle, it can be performed by using coded-mask imaging with a very long mask-detector distance. Previously, the diffraction-interference effect was thought to degrade coded-mask imaging performance dramatically at the low energy end with its very long mask-detector distance. The diffraction-interference effect is described with numerical calculations, and the diffraction-interference cross correlation reconstruction method (DICC) is developed in order to overcome the imaging performance degradation. Based on the DICC, a super-high angular resolution principle (SHARP) for coded-mask X-ray imaging is proposed. The feasibility of coded mask imaging beyond the diffraction limit of a single pinhole is demonstrated with simulations. With the specification that the mask element size is 50 x 50 mu m(2) and the mask-detector distance is 50 m, the achieved angular resolution is 0.32 arcsec above about 10 keV and 0.36 arcsec at 1.24 keV (lambda = 1 nm), where diffraction cannot be neglected. The on-axis source location accuracy is better than 0.02 arcsec. Potential applications for solar observations and wide-field X-ray monitors are also briefly discussed.
关键词instrumentation: high angular resolution techniques: image processing telescopes
学科领域Astronomy & Astrophysics
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语种英语
WOS研究方向Astronomy & Astrophysics
WOS类目Astronomy & Astrophysics
WOS记录号WOS:000264845200008
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/237031
专题粒子天体物理中心
作者单位中国科学院高能物理研究所
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Zhang, C,Zhang SN,Zhang, SN. A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole[J]. RESEARCH IN ASTRONOMY AND ASTROPHYSICS,2009,9(3):333-340.
APA Zhang, C,张双南,&Zhang, SN.(2009).A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole.RESEARCH IN ASTRONOMY AND ASTROPHYSICS,9(3),333-340.
MLA Zhang, C,et al."A super-high angular resolution principle for coded-mask X-ray imaging beyond the diffraction limit of a single pinhole".RESEARCH IN ASTRONOMY AND ASTROPHYSICS 9.3(2009):333-340.
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