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NSLS2 Fill Pattern Monitor and Control
W.X.Cheng; B.Bacha; Y.Hu; O.Singh; G.M.Wang
Source PublicationProceedings of the 4th International Beam Instrumentation Conference ; Proceedings of the 4th International Beam Instrumentation Conference
Conference Date2015
Conference PlaceAustralia
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Cited Times:0 [INSPIRE]
Document Type会议论文
AffiliationBNL, Upton, Long Island, New York, USA
Recommended Citation
GB/T 7714
W.X.Cheng,B.Bacha,Y.Hu,et al. NSLS2 Fill Pattern Monitor and Control[C],2015.
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MOPB082.pdf(711KB)会议论文 限制开放CC BY-NC-SAApplication Full Text
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