Laser flat-field system based on light scattering in nano-particle solution

doi:10.3788/OPE.20152305.1213

IHEP OpenIR > 多学科研究中心

	Laser flat-field system based on light scattering in nano-particle solution
其他题名	基于纳米颗粒溶液散射的激光平场系统
	Wang QS(王秋实); Yang FG(杨福桂); Liu DX(刘丁枭); Sheng WF(盛伟繁); Li M(李明); Wang; Qiu-Shi; Yang; Fu-Gui; Liu; Ding-Xiao; Sheng; Wei-Fan; Li; Ming
	2015
发表期刊	OPTICS AND PRECISION ENGINEERING
卷号	23 期号:5 页码:1213-1220
通讯作者	杨福桂 ; 李明
文章类型	Article
摘要	To meet the demand of the high precision correction requirements of an array detector for photo-electronic response errors, a laser flat-field system based on diffuse scattering effect of nanoparticle solution was established to generate a reference light field with a high flatness. The structure and principle of the flat-field system were introduced and some key techniques involved in the design of optical system were also given. An optical fiber was used to deliver the laser into solution efficiently to reduce the backscattering light loss on the interface. By optimizing the fiber's position and structure parameters of the cavity, the utilization of light energy was improved with a stable light field uniformity. Using improved Monte Carlo method, the effect of diffuse reflector cavity on system transmission was studied numerically. Finally, a laser flat field system was established by using Polytetrafluoroethylene (PTFE) materials with high reflectivity. Results show that the optimal position of the fiber depends on the cavity reflectivity. For high reflectance material, the optic port of the fiber near the cavity back can effectively enhance forward scattering. The laser flat field system provides the light field with a nonuniformity better than 0.3%, which basically meets the requirements of precision instruments for detector error correction, such as a long trace profiler. ©, 2015, Chinese Academy of Sciences. All right reserved.
关键词	Backscattering light CCD arrays Long trace profiler Nanoparticle solutions Non-uniform Polytetrafluoroethylene (PTFE) Precision instrument Structure parameter
DOI	10.3788/OPE.20152305.1213
收录类别	EI ; CA
WOS类目	706 Electric Transmission and Distribution ; 708 Electric and Magnetic Materials ; 711 Electromagnetic Waves ; 714.2 Semiconductor Devices and Integrated Circuits ; 721.1 Computer Theory, Includes Formal Logic, Automata Theory, Switching Theory, Programming Theory ; 741 Light, Optics and Optical Devices ; 761 Nanotechnology ; 801 Chemistry ; 803 Chemical Agents and Basic Industrial Chemicals ; 804 Chemical Products Generally ; 812 Ceramics, Refractories and Glass ; 817 Plastics and Other Polymers: Products and Applications ; 922.2 Mathematical Statistics ; 931.1 Mechanics ; 933 Solid State Physics
引用统计
文献类型	期刊论文
条目标识符	http://ir.ihep.ac.cn/handle/311005/228944
专题	多学科研究中心粒子天体物理中心
推荐引用方式 GB/T 7714	Wang QS,Yang FG,Liu DX,et al. Laser flat-field system based on light scattering in nano-particle solution[J]. OPTICS AND PRECISION ENGINEERING,2015,23(5):1213-1220.
APA	王秋实.,杨福桂.,刘丁枭.,盛伟繁.,李明.,...&Ming.(2015).Laser flat-field system based on light scattering in nano-particle solution.OPTICS AND PRECISION ENGINEERING,23(5),1213-1220.
MLA	王秋实,et al."Laser flat-field system based on light scattering in nano-particle solution".OPTICS AND PRECISION ENGINEERING 23.5(2015):1213-1220.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
4053.pdf（1672KB）	期刊论文	作者接受稿	限制开放	CC BY-NC-SA	请求全文