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Structured dark-field imaging for single nano-particles
Chen, J; Gao, K; Wang, ZL; Yun, WB; Wu, ZY; Wu ZY(吴自玉)
Source PublicationCHINESE PHYSICS B
AbstractIn this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.
Keywordx-ray microscopy Rayleigh resolution fast algorithm
Subject AreaPhysics
Indexed BySCI ; ADS ; EI
WOS Research AreaPhysics, Multidisciplinary
WOS SubjectPhysics
WOS IDWOS:000361906000062
ADS Bibcode2015ChPhB..24h6804C
ADS URLhttps://ui.adsabs.harvard.edu/abs/2015ChPhB..24h6804C
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2015ChPhB..24h6804C/citations
Citation statistics
Cited Times:1 [ADS]
Document Type期刊论文
Recommended Citation
GB/T 7714
Chen, J,Gao, K,Wang, ZL,et al. Structured dark-field imaging for single nano-particles[J]. CHINESE PHYSICS B,2015,24(8):86804.
APA Chen, J,Gao, K,Wang, ZL,Yun, WB,Wu, ZY,&吴自玉.(2015).Structured dark-field imaging for single nano-particles.CHINESE PHYSICS B,24(8),86804.
MLA Chen, J,et al."Structured dark-field imaging for single nano-particles".CHINESE PHYSICS B 24.8(2015):86804.
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