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Structured dark-field imaging for single nano-particles
Chen, J; Gao, K; Wang, ZL; Yun, WB; Wu, ZY; Wu ZY(吴自玉)
2015
发表期刊CHINESE PHYSICS B
卷号24期号:8页码:86804
文章类型Article
摘要In this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.
关键词x-ray microscopy Rayleigh resolution fast algorithm
学科领域Physics
DOI10.1088/1674-1056/24/8/086804
收录类别SCI ; EI
WOS类目Physics, Multidisciplinary
WOS记录号WOS:000361906000062
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/228792
专题多学科研究中心
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GB/T 7714
Chen, J,Gao, K,Wang, ZL,et al. Structured dark-field imaging for single nano-particles[J]. CHINESE PHYSICS B,2015,24(8):86804.
APA Chen, J,Gao, K,Wang, ZL,Yun, WB,Wu, ZY,&吴自玉.(2015).Structured dark-field imaging for single nano-particles.CHINESE PHYSICS B,24(8),86804.
MLA Chen, J,et al."Structured dark-field imaging for single nano-particles".CHINESE PHYSICS B 24.8(2015):86804.
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