X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this work, by changing the accelerating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) versus tube voltage. Experimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of similar to 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.
Wang, SH,Olbinado, MP,Momose, A,et al. Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage[J]. CHINESE PHYSICS B,2015,24(6):68703.
Wang, SH.,Olbinado, MP.,Momose, A.,Han, HJ.,Hu, RF.,...&吴自玉.(2015).Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage.CHINESE PHYSICS B,24(6),68703.
Wang, SH,et al."Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage".CHINESE PHYSICS B 24.6(2015):68703.