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An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode
Liu T(刘涛); Xie YN(谢亚宁); Hu TD(胡天斗); Liu, T; Xie, YN; Hu, TD
2000
Source PublicationNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume160Issue:2Pages:#REF!
Corresponding AuthorLiu, T (reprint author), Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China.
SubtypeArticle
AbstractA simple detector was newly designed and served to measure the XAFS spectra of Cu thin films in total-electron-yield (TEY) mode. In this technique, instead of the transmitted X-rays or X-ray fluorescence, the specimen current excited by synchrotron radiation X-rays was measured. The detector is easy to operate and does not need to employ vacuum or a helium-flowing atmosphere. To clarify its effectiveness, the local environment of Cu foil and Cu films with a different thickness was studied by the TEY detector. The results indicate a reduced coordination number and nearly unchanged interatomic distance with the decrease of the thickness of thin films. The feasibility of this technique and the fitting process of the XAFS spectra are also discussed. (C) 2000 Elsevier Science B.V. All rights reserved.
Subject AreaInstruments & Instrumentation; Nuclear Science & Technology; Physics
Indexed BySCI ; ADS
WOS SubjectInstruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear
WOS IDWOS:000084704900014
ADS Bibcode2000NIMPB.160..301L
ADS URLhttps://ui.adsabs.harvard.edu/abs/2000NIMPB.160..301L
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2000NIMPB.160..301L/citations
Citation statistics
Cited Times:0 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/227515
Collection多学科研究中心
Recommended Citation
GB/T 7714
Liu T,Xie YN,Hu TD,et al. An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2000,160(2):#REF!.
APA 刘涛,谢亚宁,胡天斗,Liu, T,Xie, YN,&Hu, TD.(2000).An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,160(2),#REF!.
MLA 刘涛,et al."An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 160.2(2000):#REF!.
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