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An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode
Liu T(刘涛); Xie YN(谢亚宁); Hu TD(胡天斗); Liu, T; Xie, YN; Hu, TD
2000
发表期刊NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
卷号160期号:2页码:#REF!
通讯作者Liu, T (reprint author), Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China.
文章类型Article
摘要A simple detector was newly designed and served to measure the XAFS spectra of Cu thin films in total-electron-yield (TEY) mode. In this technique, instead of the transmitted X-rays or X-ray fluorescence, the specimen current excited by synchrotron radiation X-rays was measured. The detector is easy to operate and does not need to employ vacuum or a helium-flowing atmosphere. To clarify its effectiveness, the local environment of Cu foil and Cu films with a different thickness was studied by the TEY detector. The results indicate a reduced coordination number and nearly unchanged interatomic distance with the decrease of the thickness of thin films. The feasibility of this technique and the fitting process of the XAFS spectra are also discussed. (C) 2000 Elsevier Science B.V. All rights reserved.
学科领域Instruments & Instrumentation; Nuclear Science & Technology; Physics
收录类别SCI
WOS类目Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear
WOS记录号WOS:000084704900014
引用统计
被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/227515
专题多学科研究中心
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GB/T 7714
Liu T,Xie YN,Hu TD,et al. An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2000,160(2):#REF!.
APA 刘涛,谢亚宁,胡天斗,Liu, T,Xie, YN,&Hu, TD.(2000).An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,160(2),#REF!.
MLA 刘涛,et al."An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 160.2(2000):#REF!.
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