An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode
Liu T(刘涛); Xie YN(谢亚宁); Hu TD(胡天斗); Liu, T; Xie, YN; Hu, TD
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
2000
卷号160期号:2页码:#REF!
学科分类Instruments & Instrumentation; Nuclear Science & Technology; Physics
通讯作者Liu, T (reprint author), Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China.
文章类型Article
英文摘要A simple detector was newly designed and served to measure the XAFS spectra of Cu thin films in total-electron-yield (TEY) mode. In this technique, instead of the transmitted X-rays or X-ray fluorescence, the specimen current excited by synchrotron radiation X-rays was measured. The detector is easy to operate and does not need to employ vacuum or a helium-flowing atmosphere. To clarify its effectiveness, the local environment of Cu foil and Cu films with a different thickness was studied by the TEY detector. The results indicate a reduced coordination number and nearly unchanged interatomic distance with the decrease of the thickness of thin films. The feasibility of this technique and the fitting process of the XAFS spectra are also discussed. (C) 2000 Elsevier Science B.V. All rights reserved.
类目[WOS]Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear
收录类别SCI
WOS记录号WOS:000084704900014
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/227515
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
中国科学院高能物理研究所_多学科研究中心
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Liu T,Xie YN,Hu TD,et al. An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2000,160(2):#REF!.
APA 刘涛,谢亚宁,胡天斗,Liu, T,Xie, YN,&Hu, TD.(2000).An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,160(2),#REF!.
MLA 刘涛,et al."An XAFS measurement of copper thin film by a simple detector in total-electron-yield mode".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 160.2(2000):#REF!.
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