Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111) | |
Wu, JJ; Zhao, LB; Zhang, GY; Liu, XL; Zhu, QS; Wang, ZG; Jia, QJ; Guo, LP; Hu, TD; Jia QJ(贾全杰)![]() ![]() | |
2008 | |
发表期刊 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE (IF:1.775[JCR-2016],1.588[5-Year]) |
卷号 | 205期号:2页码:#REF! |
通讯作者 | Wu, JJ (reprint author), Peking Univ, Sch Phys, State Key Lab Artificial Microstruct & Mesoscop P, Res Ctr Wide Gap Semicond, Beijing 100871, Peoples R China. |
文章类型 | Article |
摘要 | Crack-free GaN films have been achieved by inserting an Indoped low-temperature (LT) AlGaN interlayer grown on silicon by metalorganic chemical vapor deposition. The relationship between lattice constants c and a obtained by X-ray diffraction analysis shows that indium doping interlayer can reduce the stress in GaN layers. The stress in GaN decreases with increasing trimethylindium (TMIn) during interlayer growth. Moreover, for a smaller TMIn flow, the stress in GaN decreases dramatically when In acts as a surfactant to improve the crystallinity of the AlGaN interlayer, and for a larger TMIn flow, the stress will increase again. The decreased stress leads to smoother surfaces and fewer cracks for GaN layers by using an In-doped interlayer than by using an undoped interlayer. In doping has been found to enhance the lateral growth and reduce the growth rate of the c face. It can explain the strain relief and cracks reduction in GaN films. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
学科领域 | Materials Science; Physics |
DOI | 10.1002/pssa.200723162 |
收录类别 | SCI ; ADS |
WOS类目 | Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
WOS记录号 | WOS:000253551000013 |
ADS Bibcode | 2008PSSAR.205..294W |
ADS URL | https://ui.adsabs.harvard.edu/abs/2008PSSAR.205..294W |
ADS引文 | https://ui.adsabs.harvard.edu/abs/2008PSSAR.205..294W/citations |
引用统计 | 正在获取...
被引频次:0 [ADS]
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文献类型 | 期刊论文 |
条目标识符 | https://ir.ihep.ac.cn/handle/311005/227469 |
专题 | 多学科研究中心 |
推荐引用方式 GB/T 7714 | Wu, JJ,Zhao, LB,Zhang, GY,et al. Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111)[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,2008,205(2):#REF!. |
APA | Wu, JJ.,Zhao, LB.,Zhang, GY.,Liu, XL.,Zhu, QS.,...&胡天斗.(2008).Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111).PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,205(2),#REF!. |
MLA | Wu, JJ,et al."Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111)".PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205.2(2008):#REF!. |
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