Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique
Liu, CX; Xu, M; Luo, GM; Yang, T; Chai, CC; Mai, ZH; Lai, WY; Jiang, HY; Wu, ZH; Ding, YF; Wang, J; Jiang HY(蒋海音); Wu ZH(吴忠华); Ding YF(丁永凡); Wang J(王江)
刊名MODERN PHYSICS LETTERS B
2001
卷号15期号:9-10页码:#REF!
学科分类Physics
DOI10.1142/S0217984901001732
通讯作者Liu, CX (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
文章类型Article
英文摘要It is impossible to directly analyze the microstructure of spin-valve multilayers based on Ni, Fe, Cu and Mn by a conventional X-ray diffraction technique because the lattice parameter and atomic scattering factors of them are very close. To solve this problem, we use an X-ray anomalous diffraction technique to characterize the microstructures of the [Ni80Fe20/Fe50Mn50](15) and [Ni80Fe20/CU](15) superlattice systems. The results show that more diffraction peaks and higher intensity in the reflectivity profile are observed when the incident energy is close to the absorption edge of the lighter element (Mn) in [Ni80Fe20/Fe50Mn50](15) multilayer systems and to the absorption edge of the heavier element (Cu) in the [Ni80Fe20/Cu](15) multilayer systems. The interface and periodic structure of (Ni80Fe20/Fe50Mn50](15) are more perfect than that of the (Ni80Fe20/Cu](15) superlattices. The above results are discussed in this paper.
类目[WOS]Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical
收录类别SCI
WOS记录号WOS:000171344900005
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被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/227451
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
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Liu, CX,Xu, M,Luo, GM,et al. Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique[J]. MODERN PHYSICS LETTERS B,2001,15(9-10):#REF!.
APA Liu, CX.,Xu, M.,Luo, GM.,Yang, T.,Chai, CC.,...&王江.(2001).Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique.MODERN PHYSICS LETTERS B,15(9-10),#REF!.
MLA Liu, CX,et al."Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique".MODERN PHYSICS LETTERS B 15.9-10(2001):#REF!.
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