Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers | |
Xu, M; Luo, GM; Chai, CL; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Xu M(徐明)![]() ![]() | |
2000 | |
发表期刊 | JOURNAL OF CRYSTAL GROWTH
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卷号 | 212期号:1-2页码:#REF! |
通讯作者 | Xu, M (reprint author), Chinese Acad Sci, Inst Phys, POB 603-79, Beijing 100080, Peoples R China. |
摘要 | [Ni80Fe20/Cu](15) multilayers grown by DC-magnetron sputtering and annealed at different temperatures and/or times were investigated by low- and high-angle X-ray diffraction. Structural parameters such as superlattice period, interplane distance, average multilayer coherence length and interfacial roughness were obtained. It was found that as the annealing temperature increases the superlattice period, interplane distance, average multilayer coherence length decrease, while (1 1 1) preferred orientation of the superlattices was improved slightly. The interfacial roughness increases with increasing annealing temperature and/or time. A significant intermixing layer located in the interlayer region between the Ni80Fe20 and Cu layers was revealed by simulating the high-angle X-ray diffraction profiles. The thickness of the intermixing layer increases as the annealing temperature or annealing time increases. (C) 2000 Elsevier Science B.V. All rights reserved. |
文章类型 | Article |
关键词 | [Ni80Fe20/Cu](15) multilayers DC-magnetron sputtering microstructure X-ray diffraction |
学科领域 | Crystallography; Materials Science; Physics |
DOI | 10.1016/S0022-0248(00)00007-5 |
收录类别 | SCI |
WOS类目 | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
WOS记录号 | WOS:000086678100041 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ihep.ac.cn/handle/311005/227450 |
专题 | 多学科研究中心 粒子天体物理中心 |
推荐引用方式 GB/T 7714 | Xu, M,Luo, GM,Chai, CL,et al. Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers[J]. JOURNAL OF CRYSTAL GROWTH,2000,212(1-2):#REF!. |
APA | Xu, M.,Luo, GM.,Chai, CL.,Mai, ZH.,Lai, WY.,...&王德武.(2000).Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers.JOURNAL OF CRYSTAL GROWTH,212(1-2),#REF!. |
MLA | Xu, M,et al."Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers".JOURNAL OF CRYSTAL GROWTH 212.1-2(2000):#REF!. |
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