Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers

doi:10.1016/S0022-0248(00)00007-5

IHEP OpenIR > 多学科研究中心

	Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers
	Xu, M; Luo, GM; Chai, CL; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Xu M(徐明); Wu ZH(吴忠华); Wang DW(王德武)
	2000
发表期刊	JOURNAL OF CRYSTAL GROWTH
卷号	212 期号:1-2 页码:#REF!
通讯作者	Xu, M (reprint author), Chinese Acad Sci, Inst Phys, POB 603-79, Beijing 100080, Peoples R China.
摘要	[Ni80Fe20/Cu](15) multilayers grown by DC-magnetron sputtering and annealed at different temperatures and/or times were investigated by low- and high-angle X-ray diffraction. Structural parameters such as superlattice period, interplane distance, average multilayer coherence length and interfacial roughness were obtained. It was found that as the annealing temperature increases the superlattice period, interplane distance, average multilayer coherence length decrease, while (1 1 1) preferred orientation of the superlattices was improved slightly. The interfacial roughness increases with increasing annealing temperature and/or time. A significant intermixing layer located in the interlayer region between the Ni80Fe20 and Cu layers was revealed by simulating the high-angle X-ray diffraction profiles. The thickness of the intermixing layer increases as the annealing temperature or annealing time increases. (C) 2000 Elsevier Science B.V. All rights reserved.
文章类型	Article
关键词	[Ni80Fe20/Cu](15) multilayers DC-magnetron sputtering microstructure X-ray diffraction
学科领域	Crystallography; Materials Science; Physics
DOI	10.1016/S0022-0248(00)00007-5
收录类别	SCI
WOS类目	Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号	WOS:000086678100041
引用统计	被引频次：7[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.ihep.ac.cn/handle/311005/227450
专题	多学科研究中心粒子天体物理中心
推荐引用方式 GB/T 7714	Xu, M,Luo, GM,Chai, CL,et al. Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers[J]. JOURNAL OF CRYSTAL GROWTH,2000,212(1-2):#REF!.
APA	Xu, M.,Luo, GM.,Chai, CL.,Mai, ZH.,Lai, WY.,...&王德武.(2000).Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers.JOURNAL OF CRYSTAL GROWTH,212(1-2),#REF!.
MLA	Xu, M,et al."Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers".JOURNAL OF CRYSTAL GROWTH 212.1-2(2000):#REF!.

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