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Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers
Xu, M; Luo, GM; Chai, CL; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Xu M(徐明); Wu ZH(吴忠华); Wang DW(王德武)
2000
发表期刊JOURNAL OF CRYSTAL GROWTH
卷号212期号:1-2页码:#REF!
通讯作者Xu, M (reprint author), Chinese Acad Sci, Inst Phys, POB 603-79, Beijing 100080, Peoples R China.
文章类型Article
摘要[Ni80Fe20/Cu](15) multilayers grown by DC-magnetron sputtering and annealed at different temperatures and/or times were investigated by low- and high-angle X-ray diffraction. Structural parameters such as superlattice period, interplane distance, average multilayer coherence length and interfacial roughness were obtained. It was found that as the annealing temperature increases the superlattice period, interplane distance, average multilayer coherence length decrease, while (1 1 1) preferred orientation of the superlattices was improved slightly. The interfacial roughness increases with increasing annealing temperature and/or time. A significant intermixing layer located in the interlayer region between the Ni80Fe20 and Cu layers was revealed by simulating the high-angle X-ray diffraction profiles. The thickness of the intermixing layer increases as the annealing temperature or annealing time increases. (C) 2000 Elsevier Science B.V. All rights reserved.
关键词[Ni80Fe20/Cu](15) multilayers DC-magnetron sputtering microstructure X-ray diffraction
学科领域Crystallography; Materials Science; Physics
DOI10.1016/S0022-0248(00)00007-5
收录类别SCI
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000086678100041
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被引频次:8[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/227450
专题多学科研究中心
粒子天体物理中心
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GB/T 7714
Xu, M,Luo, GM,Chai, CL,et al. Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers[J]. JOURNAL OF CRYSTAL GROWTH,2000,212(1-2):#REF!.
APA Xu, M.,Luo, GM.,Chai, CL.,Mai, ZH.,Lai, WY.,...&王德武.(2000).Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers.JOURNAL OF CRYSTAL GROWTH,212(1-2),#REF!.
MLA Xu, M,et al."Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers".JOURNAL OF CRYSTAL GROWTH 212.1-2(2000):#REF!.
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