Self-assembled stripes on the anodic aluminum oxide by atomic force microscope observation

doi:10.1016/S0169-4332(03)00702-5

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	Self-assembled stripes on the anodic aluminum oxide by atomic force microscope observation
	Liu, HW; Guo, HM; Wang, YL; Wang, YT; Shen, CM; Wei, L; Wang YT(王雅婷); Wei L(魏龙)
	2003
发表期刊	APPLIED SURFACE SCIENCE
卷号	219 期号:3-4 页码:#REF!
通讯作者	Liu, HW (reprint author), Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, POB 603, Beijing 100080, Peoples R China.
文章类型	Article
摘要	Non-polished aluminum sheets were anodized. The nanostructures were investigated in details using an atomic force microscope (AFM). The coexistence of self-assembled stripes and porous arrays on the Al surface was observed. The formation mechanism of the stripes is discussed based on the Brusselator model. We suggest that the self-assembled patterns on the Al surface strongly depend on the competition of the formation and the dissolution rate of alumina film during the reaction process. It is also found that this type of ordered structure can only form in certain conditions. (C) 2003 Elsevier B.V. All rights reserved.
关键词	anodic aluminum oxide (AAO) atomic force microscope (AFM) Brusselator model
学科领域	Chemistry; Materials Science; Physics
DOI	10.1016/S0169-4332(03)00702-5
收录类别	SCI
WOS类目	Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS记录号	WOS:000187721300011
引用统计	被引频次：7[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.ihep.ac.cn/handle/311005/227399
专题	多学科研究中心
推荐引用方式 GB/T 7714	Liu, HW,Guo, HM,Wang, YL,et al. Self-assembled stripes on the anodic aluminum oxide by atomic force microscope observation[J]. APPLIED SURFACE SCIENCE,2003,219(3-4):#REF!.
APA	Liu, HW.,Guo, HM.,Wang, YL.,Wang, YT.,Shen, CM.,...&魏龙.(2003).Self-assembled stripes on the anodic aluminum oxide by atomic force microscope observation.APPLIED SURFACE SCIENCE,219(3-4),#REF!.
MLA	Liu, HW,et al."Self-assembled stripes on the anodic aluminum oxide by atomic force microscope observation".APPLIED SURFACE SCIENCE 219.3-4(2003):#REF!.

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