Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method
Wan DY(万冬云); He Q(何庆); Jia QJ(贾全杰); Zhang RG(张仁刚); Zhang H(张辉); Wang BY(王宝义); Wei L(魏龙); Wan, DY; He, Q; Zhang, LP; Jia, QJ; Zhang, RG; Zhang, H; Wang, BY; Wei, L
刊名JOURNAL OF CRYSTAL GROWTH
2004
卷号268期号:1-2页码:#REF!
关键词synchrotron radiation surface X-ray diffraction iron pyrite films semiconducting materials
学科分类Crystallography; Materials Science; Physics
DOI10.1016/j.jcrysgro.2004.05.014
通讯作者Wei, L (reprint author), Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, 10 Yuquan Rd, Beijing 100039, Peoples R China.
文章类型Article
英文摘要. Synchrotron radiation with surface X-ray diffraction is conducted to study pyrite FeS2 films on Si (10 0) wafers. The results show that the "strong (2 0 0) reflection" for the FeS2/Si(1 0 0) sample primarily comes from the stress peak of the silicon substrate, other than the effect of the preferred orientation of pyrite crystal grains which has been assumed previously. On the contrary, the FeS2/Si(1 0 0) sample actually indicates a strong preferred growth along (3 1 1) orientation, and this preferential growth of pyrite films becomes intenser with the prolonged annealing time. (C) 2004 Elsevier B.V. All rights reserved.
类目[WOS]Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
收录类别SCI
WOS记录号WOS:000222714700035
引用统计
被引频次:6[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/227030
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
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Wan DY,He Q,Jia QJ,et al. Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method[J]. JOURNAL OF CRYSTAL GROWTH,2004,268(1-2):#REF!.
APA 万冬云.,何庆.,贾全杰.,张仁刚.,张辉.,...&Wei, L.(2004).Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method.JOURNAL OF CRYSTAL GROWTH,268(1-2),#REF!.
MLA 万冬云,et al."Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method".JOURNAL OF CRYSTAL GROWTH 268.1-2(2004):#REF!.
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