The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRF) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis. Discrimination to escape peaks in experiments was performed. The escape peak position and intensity of 1 elements from K K-alpha to As K-alpha for each of the 14 specimens, are measured. The differences of standard and experimental values of escape peak and the nearest major peak are compared. The errors are less than 10% in general. The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K-alpha excited by X-ray. The ratios, both calculated and experimental, descend approximately from 1% to 0.1% with the atom ordinal number increasing.