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Measurement and calculation of escape peak in SR-XRF analysis
其他题名同步辐射X荧光分析中的逃逸峰的测量和计算
Kang, SX; Sun, X; Yao, K; Wu, ZQ; Huang, YY; Ju, X; Xian, DC; Huang YY(黄宇营); Ju X(巨新); Xian DC(冼鼎昌)
2001
发表期刊HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
卷号25页码:#REF!
通讯作者Kang, SX (reprint author), Univ Sci & Technol China, Dept Astron & Appl Phys, Hefei 230026, Peoples R China.
文章类型Article
摘要The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRF) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis. Discrimination to escape peaks in experiments was performed. The escape peak position and intensity of 1 elements from K K-alpha to As K-alpha for each of the 14 specimens, are measured. The differences of standard and experimental values of escape peak and the nearest major peak are compared. The errors are less than 10% in general. The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K-alpha excited by X-ray. The ratios, both calculated and experimental, descend approximately from 1% to 0.1% with the atom ordinal number increasing.
关键词synchrotron radiation X-ray fluorescence Si(Li) detector escape peak
学科领域Physics
收录类别SCI
WOS类目Physics, Nuclear ; Physics, Particles & Fields
WOS记录号WOS:000176377600008
引用统计
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/225677
专题院士
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GB/T 7714
Kang, SX,Sun, X,Yao, K,et al. Measurement and calculation of escape peak in SR-XRF analysis[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2001,25:#REF!.
APA Kang, SX.,Sun, X.,Yao, K.,Wu, ZQ.,Huang, YY.,...&冼鼎昌.(2001).Measurement and calculation of escape peak in SR-XRF analysis.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,25,#REF!.
MLA Kang, SX,et al."Measurement and calculation of escape peak in SR-XRF analysis".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 25(2001):#REF!.
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