Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films
Yu, WX; Cui, SF; Li, JH; Wu, LS; Mai, ZH; Liu, BT; Zhao, BR; Zheng, WL; Jia, QJ; Zheng WL(郑文莉); Jia QJ(贾全杰)
刊名PHYSICA C
2000
卷号337期号:1-4页码:#REF!
关键词PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 SrTiO3 films
学科分类Physics
DOI10.1016/S0921-4534(00)00052-6
通讯作者Yu, WX (reprint author), Jilin Univ, Dept Mat Sci, Changchun 130023, Peoples R China.
文章类型Article; Proceedings Paper
英文摘要A series of PbZr0.53Ti0.47O3 (PZT)/La1.85Sr0.15CuO4 (LSCO) integrated films were grown on SrTiO3 (STO)(001) substrates by DC/RF magnetron sputtering method. The film thickness of the PZT changes from 500 to 9000 Angstrom, while that of the LSCO is kept at 1000 Angstrom. The microstructures of interface and surface of the bilayer film have been investigated by small-angle X-ray reflection, high-resolution X-ray diffraction (XRD) using synchrotron radiation, scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The SEM images show island-like growth of the PZT layers with the particle size changing from 0.1 to 0.4 mu m, while the thickness of the PZT layer increased from 500 to 9000 Angstrom. The Full width at half maximums (FWHMs) of diffraction peak of the PZT layers are dramatically larger than that of LSCO layers, and the internal strains of the PZT layers are larger than that of LSCO films by an order. This indicated that the crystal perfection of the LSCO layers are better compared with PZT layers, and we attribute this to the different growth molds for PZT and LSCO films. However, no grand strain transition layers were found either in the PZT/LSCO or in the LSCO/PZT interfaces. (C) 2000 Elsevier Science B.V. All rights reserved.
类目[WOS]Physics, Applied
收录类别SCI
WOS记录号WOS:000088686400007
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/225676
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
中国科学院高能物理研究所_人力资源处
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Yu, WX,Cui, SF,Li, JH,et al. Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films[J]. PHYSICA C,2000,337(1-4):#REF!.
APA Yu, WX.,Cui, SF.,Li, JH.,Wu, LS.,Mai, ZH.,...&贾全杰.(2000).Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films.PHYSICA C,337(1-4),#REF!.
MLA Yu, WX,et al."Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films".PHYSICA C 337.1-4(2000):#REF!.
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