La0.7Ca0.3MnO3(LCMO) thin films with the thickness ranging from 5 nm to 200 nm were deposited on (001)-oriented single crystal MgO substrate by 90 degrees off-axis radio frequency magnetron sputtering. Grazing incidence X-ray diffraction technique, combined with normal X-ray diffraction, was applied to study the lattice strain and strain relaxation in LCMO films. The magnetoresistance of films were measured by means of standard four-probe technique. The results indicated that the microstrain of LCMO/MgO film began to relax when the film thickness is less than 5 nm. The LCMO film is fully strain-relaxed with thickness larger than 100 nm and exhibit LCMO bulk-like magnetoresistance properties, i.e. with relatively lager magnetoresistance ratio and higher peak temperature of magnetoresistance.
Tan, WS,Cai, HL,Liu, JS,et al. Strain relaxation and magnetoresistance of La0.7Ca0.3MnO3 film deposited on MgO substrate[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2005,29:#REF!.
Tan, WS.,Cai, HL.,Liu, JS.,Wu, XS.,Jiang, SS.,...&贾全杰.(2005).Strain relaxation and magnetoresistance of La0.7Ca0.3MnO3 film deposited on MgO substrate.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,29,#REF!.
Tan, WS,et al."Strain relaxation and magnetoresistance of La0.7Ca0.3MnO3 film deposited on MgO substrate".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 29(2005):#REF!.