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A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers
李哲;Li, Z; Tuo, XG; Shi, R; Yang, JB
2014
发表期刊SCIENCE CHINA-TECHNOLOGICAL SCIENCES
卷号57期号:1页码:19-24
摘要A new statistical fitting approach, named Statistical Distribution-Based Analytic (SDA) method, is proposed to fit single Gaussian-shaped K-alpha and K-beta X-ray peaks recorded by Si(PIN) and silicon drift detector (SDD). In this method, we use the discrete distribution theory to calculate standard deviation of energy resolution sigma. The calibration of sigma and energy (E) for two detectors between the energy ranges of 4.5-26 keV are also completed by measuring characteristic X-ray spectra of nineteen types of pure elements. With the spectrum fraction (SF) parameter proposed in this paper, the SDA method can be used to resolve overlapping peaks. In measured spectra, the Gaussian part of X-ray peaks can be fitted by a Gaussian function with two parameters, sigma and SF. This new fitting approach is simpler than traditional methods and it achieves relatively good results when fitting the complex X-ray spectra of national standard alloy samples detected by Si(PIN) and SDD detectors. The chi (r) (2) values are obtained for each spectrum to assess fitting results, and the SDA fitting method gives a preferable fit for the SDD detector.
关键词Gaussian distribution Si(PIN) SDD EDXRF standard deviation of energy resolution
学科领域Engineering; Materials Science
DOI10.1007/s11431-013-5427-7
收录类别SCI
WOS记录号WOS:000329310200004
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/225362
专题核技术应用研究中心
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GB/T 7714
李哲;Li, Z,Tuo, XG,Shi, R,et al. A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers[J]. SCIENCE CHINA-TECHNOLOGICAL SCIENCES,2014,57(1):19-24.
APA 李哲;Li, Z,Tuo, XG,Shi, R,&Yang, JB.(2014).A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers.SCIENCE CHINA-TECHNOLOGICAL SCIENCES,57(1),19-24.
MLA 李哲;Li, Z,et al."A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers".SCIENCE CHINA-TECHNOLOGICAL SCIENCES 57.1(2014):19-24.
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