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Depth profiles of the Doppler-broadening S parameter for polymers obtained with two measuring patterns: The role of accumulated charges
Yang J(杨静); 张鹏(正); 卢二阳Yang, J; Zhang, P; Lu, EY; Cao, XZ; Yu, RS; Wang, BY; Cao XZ(曹兴忠); Yu RS(于润升); Wang BY(王宝义)
2014
发表期刊NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
卷号323页码:71-74
摘要Depth profiles of Doppler broadening S parameter for oxygen containing polymer polycarbonate (PC), fluoropolymer poly (tetrafluoroethylene) (PTFE) and chlorine containing polymer polyvinylchloride-unplasticized (UPVC) were obtained with two measuring patterns, i.e. energy increase pattern and energy decrease pattern. The two curves can't coincide with each other for that a trough appeared between 1 and 5 keV in the curve obtained with energy decrease pattern. It was found that charges induced by high energy incident positrons greatly influenced the annihilation of low energy incident positrons, while charges induced by low energy incident positrons showed little influence on the annihilation of high energy incident positrons. With energy increase measuring pattern, charges induced by low energy incident positrons showed little influence on the annihilation of later incident high energy positrons, thus the measurement can give the depth profile of S parameter in polymer as it was. (C) 2014 Elsevier B.V. All rights reserved.
关键词Positron Polymers Depth profile Accumulated charges
学科领域Instruments & Instrumentation; Nuclear Science & Technology; Physics
DOI10.1016/j.nimb.2013.12.019
收录类别SCI
WOS记录号WOS:000333497800011
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/225224
专题多学科研究中心
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GB/T 7714
Yang J,Zhang P,卢二阳Yang, J,et al. Depth profiles of the Doppler-broadening S parameter for polymers obtained with two measuring patterns: The role of accumulated charges[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2014,323:71-74.
APA 杨静.,张鹏.,卢二阳Yang, J.,Zhang, P.,Lu, EY.,...&王宝义.(2014).Depth profiles of the Doppler-broadening S parameter for polymers obtained with two measuring patterns: The role of accumulated charges.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,323,71-74.
MLA 杨静,et al."Depth profiles of the Doppler-broadening S parameter for polymers obtained with two measuring patterns: The role of accumulated charges".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 323(2014):71-74.
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