A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles
Zhou L(周亮); Zhang TY(张天仪); Liu ZC(刘忠川); Zhou, L; Zhang, TY; Liu, ZC; Liu, P; Dong, YH; 刘鹏(多); Dong YH(董宇辉)
刊名ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
2014
卷号70期号:4页码:364-372
学科分类Crystallography
DOI10.1107/S2053273314007049
英文摘要With the development of X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structures of noncrystalline objects with coherent X-ray diffraction imaging. In this diffract-and-destroy mode, many snapshot diffraction patterns are obtained from the identical objects which are presented one by one in random orientations to the XFEL beam. Determination of the orientation of an individual object is essential for reconstruction of a three-dimensional structure. Here a new method, called the multiple-common-lines method, has been proposed to determine the orientations of high-and low-signal snapshot diffraction patterns. The mean errors of recovered orientations (alpha, beta, gamma) of high-and low-signal patterns are about 0.14, 0.06, 0.12 and 0.77, 0.31, 0.60 degrees, respectively; both sets of errors can meet the requirements of the reconstruction of a three-dimensional structure. (c) 2014 International Union of Crystallography
收录类别SCI
WOS记录号WOS:000341686000008
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/224788
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
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Zhou L,Zhang TY,Liu ZC,et al. A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,2014,70(4):364-372.
APA 周亮.,张天仪.,刘忠川.,Zhou, L.,Zhang, TY.,...&董宇辉.(2014).A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,70(4),364-372.
MLA 周亮,et al."A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles".ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 70.4(2014):364-372.
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