With the development of X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structures of noncrystalline objects with coherent X-ray diffraction imaging. In this diffract-and-destroy mode, many snapshot diffraction patterns are obtained from the identical objects which are presented one by one in random orientations to the XFEL beam. Determination of the orientation of an individual object is essential for reconstruction of a three-dimensional structure. Here a new method, called the multiple-common-lines method, has been proposed to determine the orientations of high-and low-signal snapshot diffraction patterns. The mean errors of recovered orientations (alpha, beta, gamma) of high-and low-signal patterns are about 0.14, 0.06, 0.12 and 0.77, 0.31, 0.60 degrees, respectively; both sets of errors can meet the requirements of the reconstruction of a three-dimensional structure. (c) 2014 International Union of Crystallography
Zhou L,Zhang TY,Liu ZC,et al. A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,2014,70(4):364-372.
周亮.,张天仪.,刘忠川.,Zhou, L.,Zhang, TY.,...&董宇辉.(2014).A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,70(4),364-372.
周亮,et al."A multiple-common-lines method to determine the orientation of snapshot diffraction patterns from single particles".ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 70.4(2014):364-372.