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Spectroscopic analysis of phase constitution of high quality VO2 thin film prepared by facile sol-gel method
Wu, YF; Fan, LL; Chen, SM; Chen, S; Zou, CW; Wu, ZY;吴自玉
2013
发表期刊AIP ADVANCES
卷号3期号:4页码:42132
摘要VO2 thin films with large-area were prepared on Al2O3 substrates by a simple sol-gel method. After an annealing treatment under low vacuum condition, all the VO2 films showed a preferred growth direction and exhibited excellent semiconductor-metal transition (SMT) characteristics. The structure and electrical properties of the obtained VO2 films were investigated systematically. Raman spectra, X-ray diffraction and X-ray absorption spectra measurements pointed out that the VO2 film on Al2O3(10 (1) over bar0) substrate showed a M1 phase instead of M2 phase as reported in previous studies. Based on the experiment results, it was suggested that the strained structure of oriented VO2 films could be a mechanism for the formation of the intermediate M2 phase, whereas it is difficult to access the pure M2 phase of undoped VO2 films. VO2 film on Al2O3 (10 (1) over bar0) substrate showed a lower SMT temperature compared to VO2 film on Al2O3 (0001), which can be mostly attributed to the differences of both lattice mismatch and thermal stress. The present results confirm and make clear the relevance of the substrate orientation in the growth of VO2 film and their different contributions to the SMT characteristics in vanadate systems. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License. [http://dx.doi.org/10.1063/1.4802981]
关键词aluminium compounds annealing metal-insulator transition Raman spectra semiconductor thin films sol-gel processing vanadium compounds X-ray absorption spectra X-ray diffraction
学科领域Science & Technology - Other Topics; Materials Science; Physics
DOI10.1063/1.4802981
收录类别SCI
WOS记录号WOS:000318271100032
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被引频次:14[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/224544
专题多学科研究中心
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Wu, YF,Fan, LL,Chen, SM,et al. Spectroscopic analysis of phase constitution of high quality VO2 thin film prepared by facile sol-gel method[J]. AIP ADVANCES,2013,3(4):42132.
APA Wu, YF,Fan, LL,Chen, SM,Chen, S,Zou, CW,&Wu, ZY;吴自玉.(2013).Spectroscopic analysis of phase constitution of high quality VO2 thin film prepared by facile sol-gel method.AIP ADVANCES,3(4),42132.
MLA Wu, YF,et al."Spectroscopic analysis of phase constitution of high quality VO2 thin film prepared by facile sol-gel method".AIP ADVANCES 3.4(2013):42132.
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