Extended depth of focus for transmission x-ray microscope
Liu, YJ; Wang, JY; Hong YL(洪友丽); Hong, YL; Wang, ZL; Zhang, K; Williams, PA; Zhu, PP; Andrews, JC; Pianetta, P; Wu, ZY;张凯; Zhu PP(朱佩平); Wu ZY(吴自玉)
Source PublicationOPTICS LETTERS
AbstractA fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy. (c) 2012 Optical Society of America
Subject AreaOptics
Indexed BySCI ; ADS
WOS IDWOS:000308595300078
ADS Bibcode2012OptL...37.3708L
ADS URLhttps://ui.adsabs.harvard.edu/abs/2012OptL...37.3708L
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2012OptL...37.3708L/citations
Citation statistics
Cited Times:8 [ADS]
Document Type期刊论文
Recommended Citation
GB/T 7714
Liu, YJ,Wang, JY,Hong YL,et al. Extended depth of focus for transmission x-ray microscope[J]. OPTICS LETTERS,2012,37(17):3708-3710.
APA Liu, YJ.,Wang, JY.,洪友丽.,Hong, YL.,Wang, ZL.,...&吴自玉.(2012).Extended depth of focus for transmission x-ray microscope.OPTICS LETTERS,37(17),3708-3710.
MLA Liu, YJ,et al."Extended depth of focus for transmission x-ray microscope".OPTICS LETTERS 37.17(2012):3708-3710.
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