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Scattering imaging method in transmission x-ray microscopy
Chen, J; Gao, K; Ge, X; Wang, ZL; Zhang, K; Hong, YL; Pan, ZY; Wu, Z; Zhu, PP; Yun, WB; Wu, ZY;张凯; Hong YL(洪友丽); Zhu PP(朱佩平); Wu ZY(吴自玉)
2013
发表期刊OPTICS LETTERS
卷号38期号:12页码:2068-2070
摘要We present a x-ray microscopy technique based on structured illumination in a microscope that characterizes the size of the subresolution-limit features. The technique is effective for characterizing fine structures substantially beyond the Rayleigh resolution of the microscope. We carried out optical experiments to demonstrate the basic principle of this new technique. Experimental results show good agreement with theoretical predictions. This technique should find a wide range of important imaging applications with a feature size down to nanometer scale, such as oil and gas reservoir rocks, advanced composites, and functional nanodevices and materials. (C) 2013 Optical Society of America
学科领域Optics
DOI10.1364/OL.38.002068
收录类别SCI
WOS记录号WOS:000320366500023
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/224187
专题多学科研究中心
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GB/T 7714
Chen, J,Gao, K,Ge, X,et al. Scattering imaging method in transmission x-ray microscopy[J]. OPTICS LETTERS,2013,38(12):2068-2070.
APA Chen, J.,Gao, K.,Ge, X.,Wang, ZL.,Zhang, K.,...&吴自玉.(2013).Scattering imaging method in transmission x-ray microscopy.OPTICS LETTERS,38(12),2068-2070.
MLA Chen, J,et al."Scattering imaging method in transmission x-ray microscopy".OPTICS LETTERS 38.12(2013):2068-2070.
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