Quantum efficiency measurement of CsI photocathodes using synchrotron radiation at BSRF
Xie YG(谢宇广); Xie, YG; Zhang AW(章爱武); Liu, HB; Zhang, AW; Liu, YB; Hu, T; Zhou, L; An, ZH; Cai, X; Fang, J; Ge, YS; Lu, QW; Shi, F; Sun, XL; Sun, LJ; Xue, Z; Yu, BX; Zheng, YH; Lu, JG;; Liu YB(刘颖彪); Hu T(胡涛); Zhou L(周莉); Cai X(蔡啸); An ZH(安振华); Fang J(方建); Yu BX(俞伯祥); Ge YS(葛永帅); Sun XL(孙希磊); Sun LJ(孙丽君); Xue Z(薛镇); Lv JG(吕军光)
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
2012
卷号664期号:1页码:310-316
关键词CsI photocathode Quantum efficiency measurement VUV Synchrotron radiation Photoionization Surface morphology
学科分类Instruments & Instrumentation; Nuclear Science & Technology; Physics; Spectroscopy
DOI10.1016/j.nima.2011.09.067
英文摘要A quantum efficiency(QE) measurement system has been established for CsI photocathodes in the wavelength range of 120-210 nm by using the synchrotron radiation light source at Beijing Synchrotron Radiation Laboratory (BSRF). An AXUV100G photodiode calibrated by Physikalisch-Technische Bundesanstalt (PTB) was used as the transfer detector standard to ensure the accuracy and reliability of the QE measurement. The dependencies of QE measurement on beam energy, vacuum pressure and bias voltage were studied in detail. The influence of photoionization in gas on the QE measurement was observed and is described. The surface morphological characteristics of both substrate and CsI film were analyzed by atomic force microscopy (AFM). The QE results of differently prepared CsI photocathodes were compared, including: the printed circuit board (PCB) of FR-4 (Woven glass and epoxy)+Cu, FR-4+Cu/Ni/Au, and stainless steel substrates; a series of thickness from 60 to 600 nm; and the resistive and electron beam evaporation techniques. (C) 2011 Elsevier B.V. All rights reserved.
收录类别SCI
WOS记录号WOS:000299592000042
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被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/223934
专题中国科学院高能物理研究所_实验物理中心_期刊论文
中国科学院高能物理研究所_实验物理中心
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Xie YG,Xie, YG,Zhang AW,et al. Quantum efficiency measurement of CsI photocathodes using synchrotron radiation at BSRF[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2012,664(1):310-316.
APA 谢宇广.,Xie, YG.,章爱武.,Liu, HB.,Zhang, AW.,...&吕军光.(2012).Quantum efficiency measurement of CsI photocathodes using synchrotron radiation at BSRF.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,664(1),310-316.
MLA 谢宇广,et al."Quantum efficiency measurement of CsI photocathodes using synchrotron radiation at BSRF".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 664.1(2012):310-316.
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