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INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY
Wu ZY(吴自玉); Kui RX(奎热西); Li G(李刚); Z.Y.Wu; K.Ibrahim; G.Li; J.Zhang; F.Q.Liu; M.I.Abbas; R.Hu; H.J.Qian; F.Q.Tang; Zhang J(张静); Liu FQ(刘凤琴); M.I.Abbas; Hu R(胡睿); Qian HJ(钱海杰)
2001
Source Publication金属学报(英文版)
Issue6Pages:473-478
Corresponding Author吴自玉
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/223279
Collection多学科研究中心
Recommended Citation
GB/T 7714
Wu ZY,Kui RX,Li G,et al. INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY[J]. 金属学报(英文版),2001(6):473-478.
APA 吴自玉.,奎热西.,李刚.,Z.Y.Wu.,K.Ibrahim.,...&钱海杰.(2001).INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY.金属学报(英文版)(6),473-478.
MLA 吴自玉,et al."INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY".金属学报(英文版) .6(2001):473-478.
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