IHEP OpenIR  > 核技术应用研究中心
GaN厚膜中的质子辐照诱生缺陷研究
Alternative TitleStudy on proton irradiation induced defects in GaN thick film
张明兰; 杨瑞霞; 李卓昕; 曹兴忠; 王宝义; 王晓晖
2013
Source Publication物理学报
ISSN1000-3290
Issue11Pages:435-438
KeywordGaN 缺陷 质子 辐照
Language中文
Funding Organization高等学校博士学科点专项科研基金(批准号:20111317120005) ; 河北省高等学校科学技术研究重点项目(批准号:ZD2010124) ; 国家自然科学基金(批准号:61076004)资助的课题~~
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/223068
Collection核技术应用研究中心
多学科研究中心
Recommended Citation
GB/T 7714
张明兰,杨瑞霞,李卓昕,等. GaN厚膜中的质子辐照诱生缺陷研究[J]. 物理学报,2013(11):435-438.
APA 张明兰,杨瑞霞,李卓昕,曹兴忠,王宝义,&王晓晖.(2013).GaN厚膜中的质子辐照诱生缺陷研究.物理学报(11),435-438.
MLA 张明兰,et al."GaN厚膜中的质子辐照诱生缺陷研究".物理学报 .11(2013):435-438.
Files in This Item:
File Name/Size DocType Version Access License
8390.pdf(290KB)期刊论文作者接受稿限制开放CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[张明兰]'s Articles
[杨瑞霞]'s Articles
[李卓昕]'s Articles
Baidu academic
Similar articles in Baidu academic
[张明兰]'s Articles
[杨瑞霞]'s Articles
[李卓昕]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[张明兰]'s Articles
[杨瑞霞]'s Articles
[李卓昕]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.