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Microstructural stability of NiO-containing spin valves annealed at room temperature
Zhang AM(张爱梅); Cai HL(蔡宏灵); Zhai ZY(翟章印); Du J(杜军); Wu XS(吴小山); Jia QJ(贾全杰)
2009
Source Publication中国物理C
Issue11Pages:944-948
AbstractMicrostructure of NiO-containing Co/Cu/Co spin valves(CCC-SV) annealed at room temperature for nearly four years has been studied by synchrotron radiation X-ray diffraction.With the annealing time expanding, the thickness of each sub-layer remains nearly unchanged while the interface roughness varie...
Keywordinterface roughness X-ray reflectivity spin valves
Funding OrganizationSupported by Open Project of Lab of Solid State Microstructures of Nanjing University (M06007) ; Doctoral Foundation of Hohai University (2084/40701117) ; Natural Science Foundation of Hohai University (2084/408307)
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/222763
Collection多学科研究中心
粒子天体物理中心
Recommended Citation
GB/T 7714
Zhang AM,Cai HL,Zhai ZY,et al. Microstructural stability of NiO-containing spin valves annealed at room temperature[J]. 中国物理C,2009(11):944-948.
APA 张爱梅,蔡宏灵,翟章印,杜军,吴小山,&贾全杰.(2009).Microstructural stability of NiO-containing spin valves annealed at room temperature.中国物理C(11),944-948.
MLA 张爱梅,et al."Microstructural stability of NiO-containing spin valves annealed at room temperature".中国物理C .11(2009):944-948.
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