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In-situ monitoring of EuTiO_3 and SrTiO_3 film growth using time-resolved X-ray scattering during pulsed-laser deposition
Wang HH(王焕华)
2009
发表期刊中国物理C
期号11页码:935-943
通讯作者王焕华
摘要Time-resolved X-ray scattering was employed to in-situ monitor the epitaxial growth process of the thin films and multilayers of EuTiO3 and SrTiO3 during pulsed laser deposition. The temporal intensity oscillations of the reflected X-rays at anti-Bragg position and the transient processes following ...
关键词time-resolved X-ray scattering PLD EuTiO3 SrTiO3 thin film multilayer
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/222760
专题多学科研究中心
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Wang HH. In-situ monitoring of EuTiO_3 and SrTiO_3 film growth using time-resolved X-ray scattering during pulsed-laser deposition[J]. 中国物理C,2009(11):935-943.
APA 王焕华.(2009).In-situ monitoring of EuTiO_3 and SrTiO_3 film growth using time-resolved X-ray scattering during pulsed-laser deposition.中国物理C(11),935-943.
MLA 王焕华."In-situ monitoring of EuTiO_3 and SrTiO_3 film growth using time-resolved X-ray scattering during pulsed-laser deposition".中国物理C .11(2009):935-943.
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