IHEP OpenIR  > 多学科研究中心
Alternative TitleLayer thickness measurement of super thin films
陈凯; 崔明启; 郑雷; 赵屹东
Source Publication强激光与粒子束
Corresponding Author陈凯
Keyword薄膜厚度 反射率拟合 Bragg衍射 Fourier变换
Funding Organization国家自然科学基金资助课题(10374088) ; 中国科学技术大学博士生创新基金资助课题
Document Type期刊论文
Recommended Citation
GB/T 7714
陈凯,崔明启,郑雷,等. nm量级薄膜厚度测量[J]. 强激光与粒子束,2008(2):234-238.
APA 陈凯,崔明启,郑雷,&赵屹东.(2008).nm量级薄膜厚度测量.强激光与粒子束(2),234-238.
MLA 陈凯,et al."nm量级薄膜厚度测量".强激光与粒子束 .2(2008):234-238.
Files in This Item:
File Name/Size DocType Version Access License
6679.pdf(1255KB)期刊论文作者接受稿限制开放CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[陈凯]'s Articles
[崔明启]'s Articles
[郑雷]'s Articles
Baidu academic
Similar articles in Baidu academic
[陈凯]'s Articles
[崔明启]'s Articles
[郑雷]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[陈凯]'s Articles
[崔明启]'s Articles
[郑雷]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.