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辐射损伤潜径迹的纳米尺度观测研究
Alternative TitleStudy on Nano-meter Scale Observation of Latent Tracks Induced by Ions
翟鹏济; 唐孝威
2002
Source Publication原子能科学技术
Issue6Pages:564-568
Corresponding Author翟鹏济
Keyword扫描隧道显微镜 扫描力显微镜 辐射损伤潜径迹 损伤参数 损伤机制
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/221975
Collection多学科研究中心
粒子天体物理中心
Recommended Citation
GB/T 7714
翟鹏济,唐孝威. 辐射损伤潜径迹的纳米尺度观测研究[J]. 原子能科学技术,2002(6):564-568.
APA 翟鹏济,&唐孝威.(2002).辐射损伤潜径迹的纳米尺度观测研究.原子能科学技术(6),564-568.
MLA 翟鹏济,et al."辐射损伤潜径迹的纳米尺度观测研究".原子能科学技术 .6(2002):564-568.
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