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纳米厚度非透明介质薄膜的测量
Alternative TitleMEASURING AND CALCULATING THE THICKNESS OF NON-TRANSPARENT DIELECTRIC THIN FILM
缪建伟; 崔明启; 唐鄂生; 修立松
1994
Source Publication光学精密工程
Issue1Pages:21--25
Corresponding Author缪建伟
Keyword椭偏仪 台阶仪 多次入射选择最佳法
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/221331
Collection多学科研究中心
Recommended Citation
GB/T 7714
缪建伟,崔明启,唐鄂生,等. 纳米厚度非透明介质薄膜的测量[J]. 光学精密工程,1994(1):21--25.
APA 缪建伟,崔明启,唐鄂生,&修立松.(1994).纳米厚度非透明介质薄膜的测量.光学精密工程(1),21--25.
MLA 缪建伟,et al."纳米厚度非透明介质薄膜的测量".光学精密工程 .1(1994):21--25.
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