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位敏电离室测X光强分布
Alternative TitleMEASUREMENT OF THE UNIFORMITY OF X-RAY ILLUMINANCE WITH POSITIONI SENSITIVE IONIZATION CHAMBER
唐鄂生; 崔明启; 王艳菊
1986
Source Publication核电子学与探测技术
Issue4Pages:212-215+198
Corresponding Author唐鄂生
KeywordX光 均匀性 位置灵敏电离室 多路扫描
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/220928
Collection多学科研究中心
Recommended Citation
GB/T 7714
唐鄂生,崔明启,王艳菊. 位敏电离室测X光强分布[J]. 核电子学与探测技术,1986(4):212-215+198.
APA 唐鄂生,崔明启,&王艳菊.(1986).位敏电离室测X光强分布.核电子学与探测技术(4),212-215+198.
MLA 唐鄂生,et al."位敏电离室测X光强分布".核电子学与探测技术 .4(1986):212-215+198.
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