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Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL
Sun DR(孙大睿); Xu JQ(徐金强); Chen SY(陈森玉)
2010
Source Publication中国物理C
Issue2Pages:227-230
Corresponding Author孙大睿
AbstractThe Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement.A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented.Based on Beijing Free Electron Laser(BFEL),the electron beam bunch length was ...
Keywordelectro-optical sampling,measurement of electron beam bunch length,non-synchronous delay scanning technique
Indexed BySCI ; ADS
Funding ProjectSupported by National Natural Science Foundation of China (10575116)
WOS IDWOS:000274309200014
ADS Bibcode2010ChPhC..34..227S
ADS URLhttps://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S/citations
Citation statistics
Cited Times:0 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/215691
Collection院士
多学科研究中心
中国科学院高能物理研究所_所办公室
Recommended Citation
GB/T 7714
Sun DR,Xu JQ,Chen SY. Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL[J]. 中国物理C,2010(2):227-230.
APA 孙大睿,徐金强,&陈森玉.(2010).Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL.中国物理C(2),227-230.
MLA 孙大睿,et al."Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL".中国物理C .2(2010):227-230.
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