| Synchrotron radiation x-ray multilayer film synthetic polarization measuring apparatus | |
Cui MQ(崔明启) ; Sun LJ(孙立娟); Xue S(薛松); Zhu J(朱杰)
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| 2009-03-17 | |
| Date Available | 2011-03-18 |
| Subtype | 授权 |
| Patent Number | HK1124659A1 |
| Document Type | 专利 |
| Identifier | http://ir.ihep.ac.cn/handle/311005/211300 |
| Collection | 多学科研究中心 |
| Affiliation | 中国科学院高能物理研究所 |
| First Author Affilication | Institute of High Energy |
| Recommended Citation GB/T 7714 | Cui MQ,Sun LJ,Xue S,et al. Synchrotron radiation x-ray multilayer film synthetic polarization measuring apparatus. HK1124659A1[P]. 2009-03-17. |
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