IHEP OpenIR  > 多学科研究中心
具有空间分辨能力的X射线微区吸收谱测量方法
张凯; 吴雪卉; 朱佩平; 袁清习; 黄万霞
2014-07-18
Date Available2014-10-29
Subtype审中
Patent NumberCN104122279A
Document Type专利
Identifierhttp://ir.ihep.ac.cn/handle/311005/211202
Collection多学科研究中心
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
张凯,吴雪卉,朱佩平,等. 具有空间分辨能力的X射线微区吸收谱测量方法. CN104122279A[P]. 2014-07-18.
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