IHEP OpenIR  > 多学科研究中心
一种获得高品质薄膜样品X射线吸收谱的方法
张静; 陈栋梁; 安鹏飞; 宋冬燕; 谢亚宁; 胡天斗
2012-12-28
Date Available2013-05-01
Subtype审中
Patent NumberCN103076352A
Document Type专利
Identifierhttp://ir.ihep.ac.cn/handle/311005/211094
Collection多学科研究中心
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
张静,陈栋梁,安鹏飞,等. 一种获得高品质薄膜样品X射线吸收谱的方法. CN103076352A[P]. 2012-12-28.
Files in This Item:
File Name/Size DocType Version Access License
CN103076352(A).pdf(535KB) 限制开放CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[张静]'s Articles
[陈栋梁]'s Articles
[安鹏飞]'s Articles
Baidu academic
Similar articles in Baidu academic
[张静]'s Articles
[陈栋梁]'s Articles
[安鹏飞]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[张静]'s Articles
[陈栋梁]'s Articles
[安鹏飞]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.