Knowledge Management System Of Institute of High Energy
Your requested [GaN厚膜中的质子辐照诱生缺陷研究] is currently limited to Institute of High Energy internal sharing.
To solicit author authorization, you need to provide the following information: name, organization, personal e-mail, reason for request. The information you provide will be reviewed and you are committed to the truth of the information provided. The personal information you provide will be protected according to law.